Impact and measurement of s

Short term threshold instabilities may cause analog circuits like comparators and analog-to-dig conventional characterization procedures have not sensitized to such issues, this kind of erratic beh occurs in products where it is very difficult to iden example prior to the introduction of a new gate sta do a careful experimental characterization of sh instabilities, which goes beyond standard measurements. A reliable forecast of the ef instabilities on the performance of analog circuits simulations taking the threshold instabilities into a